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Etched

DFT (Design For Test) Engineer

San Jose$150k–$275kfulltimemidAdded 1 month ago

About this role

Etched is seeking an experienced DFT Engineer to design and implement comprehensive test architectures for high-performance inference chips. You'll ensure robust testability from design through production, collaborating across teams to optimize test coverage, yield, and product quality in a cutting-edge AI hardware environment.

What you'll do

  • Develop DFT architectures for ASIC/SoC designs including scan insertion, BIST, and memory testing
  • Collaborate with design and verification teams to integrate testability requirements early in the design cycle
  • Analyze test results and silicon debug data to improve coverage, yield, and reliability
  • Create and execute DFT verification plans using simulation and formal verification techniques
  • Support silicon bring-up, debug, and failure analysis during post-silicon validation
  • Partner with test engineering and manufacturing teams to optimize ATE programs and test strategies

What they're looking for

  • Design For Test (DFT) methodologies and best practices
  • System Verilog and digital design verification
  • EDA tools (Synopsys DFT Compiler, Cadence Encounter Test, Mentor Tessent)
  • Scripting languages (Python, Perl, TCL)
  • Scan insertion, BIST, and Memory BIST implementation
  • Silicon debug and failure analysis
  • JTAG and IEEE standards (1149.1, 1500)
  • Mixed-signal DFT and yield analysis

Benefits

  • Medical, dental, and vision coverage with generous premium support
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Etched

Etched builds AI inference hardware, designing and manufacturing complex mechanical and electrical components for data center systems. The company is hiring mechanical engineers, PCB designers, hardware verification engineers, and software engineers to develop manufacturing processes, circuit boards, verification infrastructure, and internal tools across its hardware and operations.

Website
etched.com
View all jobs at Etched

Likely interview questions

  • Walk us through your experience implementing scan insertion and BIST methodologies in a complex ASIC or SoC design. What challenges did you face and how did you address them?
  • Describe your approach to developing a DFT verification plan and ensuring high test coverage for a high-performance chip. What tools and techniques did you use?